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» Alternative Test Methods Using IEEE 1149.4
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ESSMAC
2003
Springer
14 years 1 months ago
Analysis of Some Methods for Reduced Rank Gaussian Process Regression
Abstract. While there is strong motivation for using Gaussian Processes (GPs) due to their excellent performance in regression and classification problems, their computational com...
Joaquin Quiñonero Candela, Carl Edward Rasm...
ICIP
2007
IEEE
14 years 9 months ago
Globally Optimal Multimodal Rigid Registration: An Analytic Solution using Edge Information
Current multimodal registration methods almost always rely on local gradient-descent type optimization strategies. Such registration methods often converge to an incorrect local o...
Jeff Orchard
CIG
2005
IEEE
14 years 1 months ago
Dealing with Parameterized Actions in Behavior Testing of Commercial Computer Games
Abstract- We present a method that enhances evolutionary behavior testing of commercial computer games, as introduced in [CD+04], to deal with parameterized actions. The basic idea...
Jörg Denzinger, Kevin Loose, Darryl Gates, Jo...
ITC
2003
IEEE
102views Hardware» more  ITC 2003»
14 years 1 months ago
CMOS Built-In Test Architecture for High-Speed Jitter Measurement
A BIST method measures accumulated jitter over N periods and requires no external references. Simulation using a 0.25um process shows a 625MHz - 1GHz input range with resolution o...
Henry C. Lin, Karen Taylor, Alan Chong, Eddie Chan...
ICCD
2002
IEEE
108views Hardware» more  ICCD 2002»
14 years 4 months ago
Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-Seeding
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
Paul M. Rosinger, Bashir M. Al-Hashimi, Nicola Nic...