2451 search results - page 80 / 491 » Alternative Test Methods Using IEEE 1149.4 |
ITC
1999
IEEE
14 years 2 days ago
1999
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
DATE
1998
IEEE
14 years 2 days ago
1998
IEEE
One of the main tasks within the high-level synthesis (HLS) process is the verification problem to prove automatically the correctness of the synthesis results. Currently, the res...
ISSRE
2005
IEEE
14 years 1 months ago
2005
IEEE
The eXtensible Markup Language (XML) is widely used to transmit data across the Internet. XML schemas are used to define the syntax of XML messages. XML-based applications can re...
ATS
1996
IEEE
13 years 12 months ago
1996
IEEE
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
ISCAS
2011
IEEE
12 years 11 months ago
2011
IEEE
—A method of precise measurement of on-chip analog voltages in a mostly-digital manner, with minimal overhead, is presented. A pair of clock signals is routed to the node of an a...