2451 search results - page 88 / 491 » Alternative Test Methods Using IEEE 1149.4 |
KBSE
2007
IEEE
14 years 2 months ago
2007
IEEE
Achieving high structural coverage such as branch coverage in objectoriented programs is an important and yet challenging goal due to two main challenges. First, some branches inv...
ISQED
2002
IEEE
14 years 22 days ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
KBSE
2002
IEEE
14 years 22 days ago
2002
IEEE
In this paper we present a concept for automated testing of object-oriented applications and a tool called SeDiTeC that implements these concepts for Java applications. SeDiTeC us...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...