94 search results - page 11 / 19 » An Efficient and Effective Methodology on the Multiple Fault... |
BMCBI
2005
13 years 7 months ago
2005
Background: With the explosion of microarray studies, an enormous amount of data is being produced. Systematic integration of gene expression data from different sources increases...
ICCAD
1997
IEEE
13 years 12 months ago
1997
IEEE
A built-in self-test (BIST) methodology to test system backplanes by using BIST functionality in each of its constituent boards is presented. Since the configurations of systems ...
FPL
2006
Springer
13 years 11 months ago
2006
Springer
Reconfigurable architectures are becoming increasingly popular with space related design engineers as they are inherently flexible to meet multiple requirements and offer signific...
DAC
2003
ACM
14 years 26 days ago
2003
ACM
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
TCAD
2008
13 years 7 months ago
2008
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...