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HPCA
2006
IEEE
14 years 7 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
JCP
2008
13 years 7 months ago
2008
Abstract--In this paper, we report some results on hardware and software co-design of an adaptive linear neuron (ADALINE) based control system. A discrete-time Proportional-Integra...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
MICRO
2008
IEEE
14 years 1 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
TCAD
2008
13 years 6 months ago
2008
Abstract--This paper proposes an adaptive watermarking technique by modulating some closed cones in an originally optimized logic network (master design) for technology mapping. Th...