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ISQED
2006
IEEE
107views Hardware» more  ISQED 2006»
14 years 1 months ago
On Optimizing Scan Testing Power and Routing Cost in Scan Chain Design
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
Li-Chung Hsu, Hung-Ming Chen
DAC
2002
ACM
14 years 8 months ago
Software synthesis from synchronous specifications using logic simulation techniques
This paper addresses the problem of automatic generation of implementation software from high-level functional specifications in the context of embedded system on chip designs. So...
Yunjian Jiang, Robert K. Brayton
DAC
2008
ACM
14 years 8 months ago
On reliable modular testing with vulnerable test access mechanisms
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
Lin Huang, Feng Yuan, Qiang Xu
ETS
2011
IEEE
212views Hardware» more  ETS 2011»
12 years 7 months ago
Structural Test for Graceful Degradation of NoC Switches
Abstract—Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They can overcome defective cores, links and switches. As a side effect, yield is...
Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-J...
ICPP
2009
IEEE
13 years 5 months ago
Using Coherence Information and Decay Techniques to Optimize L2 Cache Leakage in CMPs
This paper evaluates several techniques to save leakage in CMP L2 caches by selectively switching off the less used lines. We primarily focus on private snoopy L2 caches. In this c...
Matteo Monchiero, Ramon Canal, Antonio Gonzá...