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DAC
2003
ACM
14 years 10 months ago
Test cost reduction for SOCs using virtual TAMs and lagrange multipliers
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
Anuja Sehgal, Vikram Iyengar, Mark D. Krasniewski,...
ICCAD
2010
IEEE
133views Hardware» more  ICCAD 2010»
13 years 6 months ago
Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs
Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switc...
Szu-Pang Mu, Yi-Ming Wang, Hao-Yu Yang, Mango Chia...
CCS
2008
ACM
13 years 11 months ago
Privacy oracle: a system for finding application leaks with black box differential testing
We describe the design and implementation of Privacy Oracle, a system that reports on application leaks of user information via the network traffic that they send. Privacy Oracle ...
Jaeyeon Jung, Anmol Sheth, Ben Greenstein, David W...
DAC
2003
ACM
14 years 10 months ago
Coverage directed test generation for functional verification using bayesian networks
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This paper addresses one of the main challenges of simulation based verification (or...
Shai Fine, Avi Ziv
SAC
2008
ACM
13 years 8 months ago
Efficient concept clustering for ontology learning using an event life cycle on the web
Ontology learning integrates many complementary techniques, including machine learning, natural language processing, and data mining. Specifically, clustering techniques facilitat...
Sangsoo Sung, Seokkyung Chung, Dennis McLeod