913 search results - page 27 / 183 » An Optimal Algorithm for the Automatic Generation of March T... |
ATS
1998
IEEE
14 years 1 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for th...
EVOW
2001
Springer
14 years 1 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
CG
2005
Springer
13 years 8 months ago
2005
Springer
An unstructured tetrahedral mesh generation algorithm for 3D model with constraints is presented. To automatically generate a tetrahedral mesh for model with constraints, an advan...
DSD
2010
IEEE
13 years 7 months ago
2010
IEEE
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...