35 search results - page 3 / 7 » An analytical model for negative bias temperature instabilit... |
GLVLSI
2008
IEEE
14 years 2 months ago
2008
IEEE
With the scaling down of the CMOS technologies, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging process and the ...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
A processor core, previously implemented in a 0.25m Al process, is redesigned for a 0.13m Cu process to create a dualcore processor with 1MB integrated L2 cache, offering an effic...
DATE
2010
IEEE
14 years 19 days ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
VLSID
2008
IEEE
14 years 8 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...