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INTEGRATION
2008
13 years 8 months ago
2008
Variation is a significant concern in nanometer-scale CMOS due to manufacturing equipment being pushed to fundamental limits, particularly in lithography. In this paper, we review...
VLSID
2009
IEEE
14 years 9 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
DAC
1996
ACM
14 years 1 months ago
1996
ACM
Abstract-An efficient full-wave electromagnetic analysis tool would be useful in many aspects of engineering design. Development of integral-equation based tools has been hampered ...
ICDS
2007
IEEE
14 years 3 months ago
2007
IEEE
- Smart care technology is any sensor based technology used to aid and support human independent living. Such technologies offer new potential and can give rise to new problems for...
AGILEDC
2005
IEEE
14 years 2 months ago
2005
IEEE
Most significant software processes involve a wide range of disciplines, from programming to testing, and from documentation to database development. Unfortunately, agile processe...