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ICCAD
2004
IEEE
14 years 4 months ago
2004
IEEE
— In deep sub-micron technologies, process variations can cause significant path delay and clock skew uncertainties thereby lead to timing failure and yield loss. In this paper,...
MEMOCODE
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
GECCO
2009
Springer
14 years 2 months ago
2009
Springer
As an immune inspired algorithm, the Dendritic Cell Algorithm (DCA) has been applied to a range of problems, particularly in the area of intrusion detection. Ideally, the intrusio...
WISES
2004
13 years 9 months ago
2004
-- Debugging software that runs on highly integrated System-on-Chip devices is complicated because conventional debug tools (like traditional In-Circuit Emulators and Logic Analyze...