85 search results - page 12 / 17 » Analysis and Detection of Timing Failures in an Experimental... |
VLSID
2001
IEEE
14 years 7 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Soft error tolerant design becomes more crucial due to exponential increase in the vulnerability of computer systems to soft errors. Accurate estimation of soft error rate (SER), ...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
Traditional circuit design focuses on optimizing the static critical paths no matter how infrequently these paths are exercised dynamically. Circuit optimization is then tuned to ...
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
ICIAR
2007
Springer
14 years 1 months ago
2007
Springer
This paper describes a general framework for the detection and tracking of traffic and road signs from image sequences using only color information. The approach consists of two in...