85 search results - page 8 / 17 » Analysis and Detection of Timing Failures in an Experimental... |
DAC
2011
ACM
12 years 7 months ago
2011
ACM
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
VTS
2003
IEEE
14 years 24 days ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
SAC
2006
ACM
13 years 7 months ago
2006
ACM
Fast and accurate fault detection is becoming an essential component of management software for mission critical systems. A good fault detector makes possible to initiate repair a...
GLVLSI
2009
IEEE
14 years 2 months ago
2009
IEEE
Based on the insertion of internal and external redundant wires into L-type and U-type wires, an efficient two-phase reliability-driven insertion algorithm is proposed to insert r...
DBSEC
2008
13 years 9 months ago
2008
Abstract. Many security problems only become apparent after software is deployed, and in many cases a failure has occurred prior to the awareness of the problem. Although many woul...