118 search results - page 11 / 24 » Analysis and modeling of CD variation for statistical static... |
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
VLSID
2003
IEEE
14 years 8 months ago
2003
IEEE
In this paper we present statistical timing driven hMetisbased partitioning. We approach timing driven partitioning from a different perspective: we use the statistical timing cri...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
As technology scales down, timing verification of digital integrated circuits becomes an increasingly challenging task due to the gate and wire variability. Therefore, statistical...
FTEDA
2006
13 years 7 months ago
2006
As IC technologies scale to finer feature sizes, it becomes increasingly difficult to control the relative process variations. The increasing fluctuations in manufacturing process...
DATE
2003
IEEE
14 years 28 days ago
2003
IEEE
The growing impact of within-die process variation has created the need for statistical timing analysis, where gate delays are modeled as random variables. Statistical timing anal...