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ICCAD
2006
IEEE
101views Hardware» more  ICCAD 2006»
14 years 4 months ago
Guaranteeing performance yield in high-level synthesis
Meeting timing constraint is one of the most important issues for modern design automation tools. This situation is exacerbated with the existence of process variation. Current hi...
Wei-Lun Hung, Xiaoxia Wu, Yuan Xie
DAC
2006
ACM
14 years 8 months ago
Statistical timing based on incomplete probabilistic descriptions of parameter uncertainty
Existing approaches to timing analysis under uncertainty are based on restrictive assumptions. Statistical STA techniques assume that the full probabilistic distribution of parame...
Wei-Shen Wang, Vladik Kreinovich, Michael Orshansk...
CVPR
2008
IEEE
14 years 9 months ago
Radiometric calibration with illumination change for outdoor scene analysis
The images of an outdoor scene collected over time are valuable in studying the scene appearance variation which can lead to novel applications and help enhance existing methods t...
Seon Joo Kim, Jan-Michael Frahm, Marc Pollefeys
GLVLSI
2010
IEEE
190views VLSI» more  GLVLSI 2010»
13 years 9 months ago
A linear statistical analysis for full-chip leakage power with spatial correlation
In this paper, we present an approved linear-time algorithm for statistical leakage analysis in the present of any spatial correlation condition (strong or weak). The new algorith...
Ruijing Shen, Sheldon X.-D. Tan, Jinjun Xiong
ICCAD
2006
IEEE
169views Hardware» more  ICCAD 2006»
14 years 4 months ago
Microarchitecture parameter selection to optimize system performance under process variation
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
Xiaoyao Liang, David Brooks