118 search results - page 3 / 24 » Analysis and modeling of CD variation for statistical static... |
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
DAC
2008
ACM
14 years 8 months ago
2008
ACM
Many recent techniques for timing analysis under variability, in which delay is an explicit function of underlying parameters, may be described as parameterized timing analysis. T...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
We propose gate level statistical simulation to bridge the gap between the most accurate Monte Carlo SPICE simulation and the most efficient circuit level statistical static timi...