Energy consumption is of significant concern in battery operated embedded systems. In the processors of such systems, the instruction cache consumes a significant fraction of the ...
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...
In this paper we address the the growing issue of junction tunneling leakage (Ijunc) at the circuit level. Specifically, we develop a fast approach to analyze the state-dependent ...
Static worst-case execution time (WCET) analysis is done by modeling the hardware behavior. In this paper we describe a WCET analysis technique to analyze systems with function ca...