1398 search results - page 127 / 280 » Application-Specific Integrated Circuits |
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Variability in process parameters is making accurate timing analysis of nano-scale integrated circuits an extremely challenging task. In this paper, we propose a new algorithm for...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at e...
DSN
2005
IEEE
14 years 1 months ago
2005
IEEE
1 In sub-micron technology circuits high integration levels coupled with the increased sensitivity to soft errors even at ground level make the task of guaranteeing systems’ depe...
SBCCI
2004
ACM
14 years 1 months ago
2004
ACM
This paper presents a design methodology for RF CMOS Low Noise Amplifiers (LNA). This methodology uses a current–based MOSFET model, which allows a detailed analysis of an LNA f...
ISMVL
2003
IEEE
14 years 1 months ago
2003
IEEE
A new multiple-valued current-mode (MVCM) integrated circuit based on dynamic source-coupled logic (SCL) is proposed for low-power VLSI applications. The use of a precharge-evalua...