1398 search results - page 161 / 280 » Application-Specific Integrated Circuits |
ISQED
2008
IEEE
14 years 2 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
GLVLSI
2007
IEEE
14 years 2 months ago
2007
IEEE
We present new timing and congestion driven FPGA placement algorithms with minimal runtime overhead. By predicting the post-routing critical edges and estimating congestion accura...
GLVLSI
2006
IEEE
14 years 2 months ago
2006
IEEE
In modern IC design, the number of long on-chip wires has been growing rapidly because of the increasing circuit complexity. Interconnect delay has dominated over gate delay as te...
DAC
2006
ACM
14 years 2 months ago
2006
ACM
Silicon design implementation has become increasingly complex with the deep submicron technologies such as 90nm and below. It is common to see multiple processor cores, several ty...
DAC
2006
ACM
14 years 2 months ago
2006
ACM
Orthogonal Frequency Division Multiplexing (OFDM) is the modulation of choice for broadband wireless communications. Unfortunately, it comes at the cost of a very low energy effic...