1398 search results - page 164 / 280 » Application-Specific Integrated Circuits |
GLVLSI
2010
IEEE
14 years 1 months ago
2010
IEEE
This paper investigates read-out schemes for a crossbar memory using CNTFET-based elements as cross-points. Two read-out schemes are presented in this paper; the first scheme bias...
GLVLSI
2000
IEEE
14 years 13 days ago
2000
IEEE
Circuit interconnect has become a substantial obstacle in the design of high performance systems. In this paper we explore a new routing paradigm that strikes at the root of the i...
ICCAD
1994
IEEE
14 years 4 days ago
1994
IEEE
We present a loosely coupled parallel algorithm for the placement of standard cell integrated circuits. Our algorithm is a derivative of simulated annealing. The implementation of...
DAC
2010
ACM
13 years 12 months ago
2010
ACM
The identification of speedpaths is required for post-silicon (PS) timing validation, and it is currently becoming timeconsuming due to manufacturing variations. In this paper we...
DATE
2009
IEEE
13 years 12 months ago
2009
IEEE
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...