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DAC
2006
ACM
14 years 9 months ago
Are carbon nanotubes the future of VLSI interconnections?
Increasing resistivity of copper with scaling and rising demands on current density requirements are driving the need to identify new wiring solutions for deep nanometer scale VLS...
Kaustav Banerjee, Navin Srivastava
ICCAD
2008
IEEE
130views Hardware» more  ICCAD 2008»
14 years 4 months ago
Lightweight secure PUFs
— To ensure security and robustness of the next generation of Physically Unclonable Functions (PUFs), we have developed a new methodology for PUF design. Our approach employs int...
Mehrdad Majzoobi, Farinaz Koushanfar, Miodrag Potk...
ICCAD
2006
IEEE
126views Hardware» more  ICCAD 2006»
14 years 4 months ago
Optimizing yield in global routing
We present the first efficient approach to global routing that takes spacing-dependent costs into account and provably finds a near-optimum solution including these costs. We sh...
Dirk Müller
ICCAD
2001
IEEE
74views Hardware» more  ICCAD 2001»
14 years 4 months ago
Techniques for Including Dielectrics when Extracting Passive Low-Order Models of High Speed Interconnect
Interconnect structures including dielectrics can be modeled by an integral equation method using volume currents and surface charges for the conductors, and volume polarization c...
Luca Daniel, Alberto L. Sangiovanni-Vincentelli, J...
ICCAD
2001
IEEE
108views Hardware» more  ICCAD 2001»
14 years 4 months ago
Multigrid-Like Technique for Power Grid Analysis
— Modern sub-micron VLSI designs include huge power grids that are required to distribute large amounts of current, at increasingly lower voltages. The resulting voltage drop on ...
Joseph N. Kozhaya, Sani R. Nassif, Farid N. Najm