1398 search results - page 21 / 280 » Application-Specific Integrated Circuits |
ASPDAC
2008
ACM
14 years 2 days ago
2008
ACM
This paper presents an all digital measurement circuit called "gated oscillator" for capturing waveforms of dynamic power supply noise. The gated oscillator is constructe...
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
As semiconductor manufacturing requires greater capital investments, the use of contract foundries has grown dramatically, increasing exposure to mask theft and unauthorized exces...
ICTAI
2002
IEEE
14 years 3 months ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
CASES
2008
ACM
14 years 1 days ago
2008
ACM
We introduce the first approach that can actively control multiple hardware intellectual property (IP) cores used in an integrated circuit (IC). The IP rights owner(s) can remotel...
DATE
1997
IEEE
14 years 2 months ago
1997
IEEE
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...