1398 search results - page 46 / 280 » Application-Specific Integrated Circuits |
TE
2010
13 years 3 months ago
2010
Abstract--As demand increases for circuits with higher performance, higher complexity, and decreased feature size, asynchronous (clockless) paradigms will become more widely used i...
DATE
2002
IEEE
14 years 1 months ago
2002
IEEE
In this paper, a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worst-case parameter sets. These set...
VTS
2000
IEEE
14 years 22 days ago
2000
IEEE
Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to...
AHS
2007
IEEE
13 years 10 months ago
2007
IEEE
Fault Tolerance is an increasing challenge for integrated circuits due to semiconductor technology scaling. This paper looks at how artificial evolution may be tuned to the creat...
DAC
2007
ACM
14 years 9 months ago
2007
ACM
Thermal problems and limitations on interlayer via densities are important design constraints on three-dimensional integrated circuits (3D ICs), and need to be considered during g...