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DAC
2003
ACM
14 years 8 months ago
A cost-driven lithographic correction methodology based on off-the-shelf sizing tools
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...
SIGSOFT
2008
ACM
14 years 8 months ago
The implications of method placement on API learnability
To better understand what makes Application Programming Interfaces (APIs) hard to use and how to improve them, recent research has begun studying programmers' strategies and ...
Jeffrey Stylos, Brad A. Myers
VLSID
2002
IEEE
142views VLSI» more  VLSID 2002»
14 years 7 months ago
Address Code and Arithmetic Optimizations for Embedded Systems
An important class of problems used widely in both the embedded systems and scientific domains perform memory intensive computations on large data sets. These data sets get to be ...
J. Ramanujam, Satish Krishnamurthy, Jinpyo Hong, M...
HPCA
2008
IEEE
14 years 7 months ago
Automated microprocessor stressmark generation
Estimating the maximum power and thermal characteristics of a processor is essential for designing its power delivery system, packaging, cooling, and power/thermal management sche...
Ajay M. Joshi, Lieven Eeckhout, Lizy Kurian John, ...
MOBIHOC
2007
ACM
14 years 7 months ago
Capacity scaling in delay tolerant networks with heterogeneous mobile nodes
We provide a general framework for the analysis of the capacity scaling properties in mobile ad-hoc networks with heterogeneous nodes and spatial inhomogeneities. Existing analyti...
Michele Garetto, Paolo Giaccone, Emilio Leonardi