7213 search results - page 1413 / 1443 » Automated model grouping |
DAC
2004
ACM
14 years 10 months ago
2004
ACM
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...
DAC
2005
ACM
14 years 10 months ago
2005
ACM
Device optimization considering supply voltage Vdd and threshold voltage Vt tuning does not increase chip area but has a great impact on power and performance in the nanometer tec...
DAC
2006
ACM
14 years 10 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
DAC
2006
ACM
14 years 10 months ago
2006
ACM
With ever-increasing power density and cooling costs in modern high-performance systems, dynamic thermal management (DTM) has emerged as an effective technique for guaranteeing th...
WWW
2009
ACM
14 years 10 months ago
2009
ACM
Social Networking is one of the major technological phenomena of the Web 2.0, with hundreds of millions of people participating. Social networks enable a form of self expression f...