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» Automating commutativity analysis at the design level
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DAC
2006
ACM
14 years 8 months ago
Unknown-tolerance analysis and test-quality control for test response compaction using space compactors
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. ali...
Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon W...
SERP
2007
13 years 9 months ago
From Functional Requirements through Test Evaluation Design to Automatic Test Data Patterns Retrieval - a Concept for Testing of
- Functional testing of software dedicated for hybrid embedded systems should start at the early development phase and requires analysis of discrete and continuous signals, where t...
Justyna Zander-Nowicka, Abel Marrero Pérez,...
DAC
2009
ACM
14 years 8 months ago
Analysis and mitigation of process variation impacts on Power-Attack Tolerance
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
Lang Lin, Wayne P. Burleson
GIS
2002
ACM
13 years 7 months ago
Design of field wrappers for mobile field data collection
In mobile field data collection, data gatherer requires to get geospatial information service to support in navigating to the right locations, describing context of observed objec...
Peisheng Zhao, Sarah Nusser, Leslie L. Miller
DAC
2004
ACM
14 years 8 months ago
Circuit-aware architectural simulation
Architectural simulation has achieved a prominent role in the system design cycle by providing designers the ability to quickly examine a wide variety of design choices. However, ...
Seokwoo Lee, Shidhartha Das, Valeria Bertacco, Tod...