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» Balance Testing of Logic Circuits
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ISCA
2009
IEEE
159views Hardware» more  ISCA 2009»
14 years 2 months ago
End-to-end register data-flow continuous self-test
While Moore’s Law predicts the ability of semi-conductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in t...
Javier Carretero, Pedro Chaparro, Xavier Vera, Jau...
ITC
2003
IEEE
148views Hardware» more  ITC 2003»
14 years 26 days ago
HyAC: A Hybrid Structural SAT Based ATPG for Crosstalk
As technology evolves into the deep sub-micron era, signal integrity problems are growing into a major challenge. An important source of signal integrity problems is the crosstalk...
Xiaoliang Bai, Sujit Dey, Angela Krstic
DAC
2000
ACM
14 years 8 months ago
Symbolic timing simulation using cluster scheduling
We recently introduced symbolic timing simulation (STS) using data-dependent delays as a tool for verifying the timing of fullcustom transistor-level circuit designs, and for the ...
Clayton B. McDonald, Randal E. Bryant
DAC
1994
ACM
13 years 11 months ago
Dynamic Search-Space Pruning Techniques in Path Sensitization
A powerful combinational path sensitization engine is required for the efficient implementation of tools for test pattern generation, timing analysis, and delay fault testing. Path...
João P. Marques Silva, Karem A. Sakallah
DAC
2006
ACM
14 years 8 months ago
A new LP based incremental timing driven placement for high performance designs
In this paper, we propose a new linear programming based timing driven placement framework for high performance designs. Our LP framework is mainly net-based, but it takes advanta...
Tao Luo, David Newmark, David Z. Pan