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» Balance Testing of Logic Circuits
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DATE
1998
IEEE
153views Hardware» more  DATE 1998»
14 years 26 days ago
An Energy-Conscious Exploration Methodology for Reconfigurable DSPs
As the "system-on-a-chip" concept is rapidly becoming a reality, time-to-market and product complexity push the reuse of complex macromodules. Circuits combining a varie...
Jan M. Rabaey, Marlene Wan
DAC
2006
ACM
14 years 2 months ago
Design in reliability for communication designs
Silicon design implementation has become increasingly complex with the deep submicron technologies such as 90nm and below. It is common to see multiple processor cores, several ty...
Uday Reddy Bandi, Murty Dasaka, Pavan K. Kumar
GLVLSI
2010
IEEE
156views VLSI» more  GLVLSI 2010»
14 years 1 months ago
A multi-level approach to reduce the impact of NBTI on processor functional units
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
Taniya Siddiqua, Sudhanva Gurumurthi
FPGA
2004
ACM
234views FPGA» more  FPGA 2004»
14 years 9 days ago
An embedded true random number generator for FPGAs
Field Programmable Gate Arrays (FPGAs) are an increasingly popular choice of platform for the implementation of cryptographic systems. Until recently, designers using FPGAs had le...
Paul Kohlbrenner, Kris Gaj
DT
2000
88views more  DT 2000»
13 years 8 months ago
Postsilicon Validation Methodology for Microprocessors
f abstraction as applicable to break the problem's complexity, and innovating better techniques to address complexity of new microarchitectural features. Validation techniques...
Hemant G. Rotithor