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DATE
2006
IEEE
115views Hardware» more  DATE 2006»
14 years 5 months ago
Optimal periodic testing of intermittent faults in embedded pipelined processor applications
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
Nektarios Kranitis, Andreas Merentitis, N. Laoutar...
GECCO
2005
Springer
160views Optimization» more  GECCO 2005»
14 years 4 months ago
Designing resilient networks using a hybrid genetic algorithm approach
As high-speed networks have proliferated across the globe, their topologies have become sparser due to the increased capacity of communication media and cost considerations. Relia...
Abdullah Konak, Alice E. Smith
ISQED
2002
IEEE
123views Hardware» more  ISQED 2002»
14 years 3 months ago
Reliable Laser Programmable Gate Array Technology
Field-Programmable Gate Arrays have become popular
Zhuo Gao, Ji Luo, Hu Huang, Wei Zhang, Joseph B. B...
VLSID
2003
IEEE
104views VLSI» more  VLSID 2003»
14 years 11 months ago
Analyzing Soft Errors in Leakage Optimized SRAM Design
Reducing leakage power and improving the reliability of data stored in the memory cells are both becoming challenging as technology scales down. While the smaller threshold voltag...
Vijay Degalahal, Narayanan Vijaykrishnan, Mary Jan...
CSCWD
2007
Springer
14 years 5 months ago
Supporting the Development of Applications in Heterogeneous Ubiquitous Computing Environments
Ubiquitous computing is increasingly becoming part of our lives. Various computing devices, having different sizes and capabilities, and using different software platforms are part...
Nelson Baloian, Gustavo Zurita