5604 search results - page 31 / 1121 » Becoming Increasingly Reliable |
AINA
2008
IEEE
14 years 5 months ago
2008
IEEE
With quick evolution of grid technologies and increasing complexity of e-Science applications, reasoning temporal properties of grid workflows to ensure reliability and trustworth...
ICPR
2008
IEEE
14 years 5 months ago
2008
IEEE
Facial feature tracking is a crucial and challenging task in computer vision. Recently online-learning methods have become increasingly popular on account of their strong ability ...
DATE
2007
IEEE
14 years 5 months ago
2007
IEEE
RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...
ISQED
2007
IEEE
14 years 5 months ago
2007
IEEE
This paper predicts self-heating effect in a short intrablock wire will arise as a design issue with technology scaling. The short intra-block wires are close to the substrate an...
FPGA
2007
ACM
14 years 5 months ago
2007
ACM
Chip design in the nanometer regime is becoming increasingly difficult due to process variations. ASIC designers have adopted statistical optimization techniques to mitigate the e...