5604 search results - page 7 / 1121 » Becoming Increasingly Reliable |
ASPLOS
2010
ACM
14 years 4 months ago
2010
ACM
Aggressive technology scaling provides designers with an ever increasing budget of cheaper and faster transistors. Unfortunately, this trend is accompanied by a decline in individ...
DAC
2008
ACM
14 years 10 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
DAC
2006
ACM
14 years 3 months ago
2006
ACM
Silicon design implementation has become increasingly complex with the deep submicron technologies such as 90nm and below. It is common to see multiple processor cores, several ty...
DATE
2005
IEEE
14 years 3 months ago
2005
IEEE
Importance of addressing soft errors in both safety critical applications and commercial consumer products is increasing, mainly due to ever shrinking geometries, higher-density c...
ISQED
2011
IEEE
13 years 1 months ago
2011
IEEE
As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...