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DAC
2007
ACM
14 years 8 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2005
ACM
14 years 8 months ago
Locality-conscious workload assignment for array-based computations in MPSOC architectures
While the past research discussed several advantages of multiprocessor-system-on-a-chip (MPSOC) architectures from both area utilization and design verification perspectives over ...
Feihui Li, Mahmut T. Kandemir
HPCA
2008
IEEE
14 years 7 months ago
System level analysis of fast, per-core DVFS using on-chip switching regulators
Portable, embedded systems place ever-increasing demands on high-performance, low-power microprocessor design. Dynamic voltage and frequency scaling (DVFS) is a well-known techniq...
Wonyoung Kim, Meeta Sharma Gupta, Gu-Yeon Wei, Dav...
SIGMOD
2009
ACM
168views Database» more  SIGMOD 2009»
14 years 7 months ago
Database research in computer games
This tutorial presents an overview of the data management issues faced by computer games today. While many games do not use databases directly, they still have to process large am...
Alan J. Demers, Johannes Gehrke, Christoph Koch, B...
DATE
2009
IEEE
119views Hardware» more  DATE 2009»
14 years 2 months ago
Bitstream relocation with local clock domains for partially reconfigurable FPGAs
—Partial Reconfiguration (PR) of FPGAs presents many opportunities for application design flexibility, enabling tasks to dynamically swap in and out of the FPGA without entire sy...
Adam Flynn, Ann Gordon-Ross, Alan D. George