1343 search results - page 252 / 269 » Bounded-lifetime integrated circuits |
DATE
2010
IEEE
14 years 15 days ago
2010
IEEE
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
DATE
2010
IEEE
14 years 15 days ago
2010
IEEE
—Temperature has a strong influence on integrated circuit (IC) performance, power consumption, and reliability. However, accurate thermal analysis can impose high computation co...
DATE
2002
IEEE
14 years 11 days ago
2002
IEEE
Abstract—Antenna problem is a phenomenon of plasma-induced gateoxide degradation. It directly affects manufacturability of very large scale integration (VLSI) circuits, especiall...
GLVLSI
2002
IEEE
14 years 11 days ago
2002
IEEE
We present a low-power sine-output Direct Digital Frequency Synthesizer (DDFS) realized in 0.18 µm CMOS that achieves 60 dBc spectral purity from DC to the Nyquist frequency. No ...
ISSS
2002
IEEE
14 years 10 days ago
2002
IEEE
ForSyDe (FORmal SYstem DEsign) is a methodology which addresses the design of SoC applications which may contain control as well as data flow dominated parts. Starting with a for...