1343 search results - page 38 / 269 » Bounded-lifetime integrated circuits |
3DIC
2009
IEEE
14 years 3 months ago
2009
IEEE
Abstract—Modeling parasitic parameters of Through-SiliconVia (TSV) structures is essential in exploring electrical characteristics such as delay and signal integrity (SI) of circ...
ASPDAC
2006
ACM
14 years 2 months ago
2006
ACM
Abstract— With technology scaling, on-chip power densities are growing steadily, leading to the point where temperature has become an important consideration in the design of ele...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
As semiconductor manufacturing requires greater capital investments, the use of contract foundries has grown dramatically, increasing exposure to mask theft and unauthorized exces...
ICTAI
2002
IEEE
14 years 1 months ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
A new algorithm is presented that combines performance and variation objectives in a behavioural model for a given analogue circuit topology and process. The tradeoffs between per...