2 search results - page 1 / 1 » CMOS Built-In Test Architecture for High-Speed Jitter Measur... |
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
A BIST method measures accumulated jitter over N periods and requires no external references. Simulation using a 0.25um process shows a 625MHz - 1GHz input range with resolution o...
VTS
2005
IEEE
14 years 3 months ago
2005
IEEE
This paper presents the design of an on-chip spectrum analyzer. A novel architecture is used to mitigate the problems encountered in trying to implement architectures employed in ...