Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Portable, embedded systems place ever-increasing demands on high-performance, low-power microprocessor design. Dynamic voltage and frequency scaling (DVFS) is a well-known techniq...
Wonyoung Kim, Meeta Sharma Gupta, Gu-Yeon Wei, Dav...
Clock meshes have found increasingly wide applications in today’s high-performance IC designs. The inherent routing redundancies associated with clock meshes lead to improved cl...
Xiaoji Ye, Min Zhao, Rajendran Panda, Peng Li, Jia...
With the recent design shift towards increasing the number of processing elements in a chip, high-bandwidth support in on-chip interconnect is essential for low-latency communicat...
As the number of transistors integrated on a chip continues to increase, a growing challenge is accurately modeling performance in the early stages of processor design. Analytical...