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» Challenges in Physical Chip Design
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DAC
2007
ACM
14 years 10 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
HPCA
2008
IEEE
14 years 9 months ago
System level analysis of fast, per-core DVFS using on-chip switching regulators
Portable, embedded systems place ever-increasing demands on high-performance, low-power microprocessor design. Dynamic voltage and frequency scaling (DVFS) is a well-known techniq...
Wonyoung Kim, Meeta Sharma Gupta, Gu-Yeon Wei, Dav...
ISQED
2008
IEEE
153views Hardware» more  ISQED 2008»
14 years 3 months ago
Accelerating Clock Mesh Simulation Using Matrix-Level Macromodels and Dynamic Time Step Rounding
Clock meshes have found increasingly wide applications in today’s high-performance IC designs. The inherent routing redundancies associated with clock meshes lead to improved cl...
Xiaoji Ye, Min Zhao, Rajendran Panda, Peng Li, Jia...
MICRO
2008
IEEE
139views Hardware» more  MICRO 2008»
14 years 3 months ago
Adaptive data compression for high-performance low-power on-chip networks
With the recent design shift towards increasing the number of processing elements in a chip, high-bandwidth support in on-chip interconnect is essential for low-latency communicat...
Yuho Jin, Ki Hwan Yum, Eun Jung Kim
MICRO
2008
IEEE
138views Hardware» more  MICRO 2008»
14 years 3 months ago
Hybrid analytical modeling of pending cache hits, data prefetching, and MSHRs
As the number of transistors integrated on a chip continues to increase, a growing challenge is accurately modeling performance in the early stages of processor design. Analytical...
Xi E. Chen, Tor M. Aamodt