13 search results - page 2 / 3 » Characterization of CMOS Defects using Transient Signal Anal... |
ITC
1999
IEEE
13 years 11 months ago
1999
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
ITC
2000
IEEE
13 years 12 months ago
2000
IEEE
Transient Signal Analysis (TSA) is a Go/No-Go device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, a technique based o...
DSN
2004
IEEE
13 years 11 months ago
2004
IEEE
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
— The inductance and coupling effects in interconnects and non-linear receiver loads has resulted in complex input signals and output loads for gates in the modern deep submicron...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
This paper proposes a scheme that captures diverse input waveforms of CMOS gates for static timing analysis. Conventionally the latest arrival time and transition time are calcula...