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DAC
2006
ACM
14 years 9 months ago
Statistical logic cell delay analysis using a current-based model
A statistical model for the purpose of logic cell timing analysis in the presence of process variations is presented. A new current-based cell delay model is utilized, which can a...
Hanif Fatemi, Shahin Nazarian, Massoud Pedram
DAC
2006
ACM
14 years 9 months ago
Formal analysis of hardware requirements
Formal languages are increasingly used to describe the functional requirements (specifications) of circuits. These requirements are used as a means to communicate design intent an...
Ingo Pill, Simone Semprini, Roberto Cavada, Marco ...
DAC
2006
ACM
14 years 9 months ago
Statistical timing analysis with correlated non-gaussian parameters using independent component analysis
We propose a scalable and efficient parameterized block-based statistical static timing analysis algorithm incorporating both Gaussian and non-Gaussian parameter distributions, ca...
Jaskirat Singh, Sachin S. Sapatnekar
DAC
2006
ACM
14 years 9 months ago
Criticality computation in parameterized statistical timing
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
Jinjun Xiong, Vladimir Zolotov, Natesan Venkateswa...
DAC
2006
ACM
14 years 9 months ago
Process variation aware OPC with variational lithography modeling
Optical proximity correction (OPC) is one of the most widely used resolution enhancement techniques (RET) in nanometer designs to improve subwavelength printability. Conventional ...
Peng Yu, Sean X. Shi, David Z. Pan