217 search results - page 5 / 44 » Closed-Form Simulation and Robustness Models for SEU-Toleran... |
ISQED
2008
IEEE
14 years 1 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
DATE
2004
IEEE
13 years 11 months ago
2004
IEEE
This paper presents an environment based on SystemC for architecture specification of programmable systems. Making use of the new architecture description language ArchC, able to ...
WSC
1998
13 years 9 months ago
1998
Robustness has become a popular issue in engineering. For products, Taguchi suggests to adjust the design so that product performance is insensitive to the effects of uncontrolled...
VTS
2006
IEEE
14 years 1 months ago
2006
IEEE
Abstract: An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU...
BMCBI
2011
12 years 11 months ago
2011
Background: The cost efficient two-stage design is often used in genome-wide association studies (GWASs) in searching for genetic loci underlying the susceptibility for complex di...