Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
Power density has been increasing at an alarming rate in recent processor generations resulting in high on-chip temperature. Higher temperature results in poor reliability and inc...
At-speed testing of GHz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost, high-quality self-test m...
Li Chen, Sujit Dey, Pablo Sanchez, Krishna Sekar, ...
Cutting-edge applications of future embedded systems demand highest processor performance with low power consumption to get acceptable battery-life times. Therefore, low power opt...
Anupam Chattopadhyay, B. Geukes, David Kammler, Er...
A critical component in the design of secure processors is memory encryption which provides protection for the privacy of code and data stored in off-chip memory. The overhead of ...