966 search results - page 30 / 194 » Code Generation for Embedded Processors |
DATE
2004
IEEE
14 years 14 days ago
2004
IEEE
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
VLSID
2009
IEEE
14 years 9 months ago
2009
IEEE
Power density has been increasing at an alarming rate in recent processor generations resulting in high on-chip temperature. Higher temperature results in poor reliability and inc...
DAC
2000
ACM
14 years 9 months ago
2000
ACM
At-speed testing of GHz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost, high-quality self-test m...
DATE
2006
IEEE
14 years 2 months ago
2006
IEEE
Cutting-edge applications of future embedded systems demand highest processor performance with low power consumption to get acceptable battery-life times. Therefore, low power opt...
HIPEAC
2007
Springer
14 years 2 months ago
2007
Springer
A critical component in the design of secure processors is memory encryption which provides protection for the privacy of code and data stored in off-chip memory. The overhead of ...