138 search results - page 8 / 28 » Compaction-based test generation using state and fault infor... |
ASPDAC
2005
ACM
13 years 9 months ago
2005
ACM
Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults t...
ATS
2003
IEEE
14 years 23 days ago
2003
IEEE
Software-based self-testing is a promising approach for the testing of processor cores which are embedded inside a System-on-a-Chip (SoC), as it can apply test vectors in function...
INFSOF
2011
13 years 2 months ago
2011
Context: Service Oriented Architectures (SOA) have emerged as a new paradigm to develop interoperable and highly dynamic applications. Objective: This paper aims to identify the s...
VLSID
1996
IEEE
13 years 11 months ago
1996
IEEE
W epropose a coverage metric and a two-pass test generation method for path delay faults in combinational logic circuits. The coverage is measured for each line with a rising and ...
ICCAD
2000
IEEE
13 years 12 months ago
2000
IEEE
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...