550 search results - page 69 / 110 » Complementarity of Error Detection Techniques |
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
BELL
2000
13 years 8 months ago
2000
A significant part of the call processing software for Lucent's new PathStar access server [FSW98] was checked with automated formal verification techniques. The verification...
ISCA
2010
IEEE
14 years 27 days ago
2010
IEEE
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
ECBS
2007
IEEE
14 years 3 months ago
2007
IEEE
Automated diagnosis of errors detected during software testing can improve the efficiency of the debugging process, and can thus help to make software more reliable. In this pape...