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ATS
2000
IEEE
86views Hardware» more  ATS 2000»
14 years 2 months ago
An adjacency-based test pattern generator for low power BIST design
Patrick Girard, Loïs Guiller, Christian Landr...
ITC
2000
IEEE
53views Hardware» more  ITC 2000»
14 years 2 months ago
Using on-chip test pattern compression for full scan SoC designs
Helmut Lang, Jens Pfeiffer, Jeff Maguire