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2463
search results - page 25 / 493
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Compressed Pattern Databases
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DATE
2009
IEEE
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Hardware
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Improving compressed test pattern generation for multiple scan chain failure diagnosis
14 years 4 months ago
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www.date-conference.com
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...
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DCC
2009
IEEE
305
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Computer Graphics
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DCC 2009
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Suffix Tree Based VF-Coding for Compressed Pattern Matching
14 years 10 months ago
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www-alg.ist.hokudai.ac.jp
Takuya Kida
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ITC
2000
IEEE
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Hardware
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ITC 2000
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Using on-chip test pattern compression for full scan SoC designs
14 years 2 months ago
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www.lirmm.fr
Helmut Lang, Jens Pfeiffer, Jeff Maguire
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CPM
1999
Springer
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Combinatorics
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CPM 1999
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Shift-And Approach to Pattern Matching in LZW Compressed Text
14 years 2 months ago
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www.i.kyushu-u.ac.jp
Takuya Kida, Masayuki Takeda, Ayumi Shinohara, Set...
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VISAPP
2008
145
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Computer Vision
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VISAPP 2008
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On the Contribution of Compression to Visual Pattern Recognition
13 years 11 months ago
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www.knt.vein.hu
Gunther Heidemann, Helge Ritter
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