Sciweavers

2463 search results - page 25 / 493
» Compressed Pattern Databases
Sort
View
139
Voted
DATE
2009
IEEE
94views Hardware» more  DATE 2009»
15 years 10 months ago
Improving compressed test pattern generation for multiple scan chain failure diagnosis
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...
83
Voted
ITC
2000
IEEE
53views Hardware» more  ITC 2000»
15 years 8 months ago
Using on-chip test pattern compression for full scan SoC designs
Helmut Lang, Jens Pfeiffer, Jeff Maguire
119
Voted
CPM
1999
Springer
93views Combinatorics» more  CPM 1999»
15 years 8 months ago
Shift-And Approach to Pattern Matching in LZW Compressed Text
Takuya Kida, Masayuki Takeda, Ayumi Shinohara, Set...
75
Voted
VISAPP
2008
15 years 5 months ago
On the Contribution of Compression to Visual Pattern Recognition
Gunther Heidemann, Helge Ritter