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» Compressing Pattern Databases

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DATE
2009
IEEE

94views Hardware» more DATE 2009»

Improving compressed test pattern generation for multiple scan chain failure diagnosis

14 years 2 months ago

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To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...

Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...

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DCC
2009
IEEE

305views Computer Graphics» more DCC 2009»

Suffix Tree Based VF-Coding for Compressed Pattern Matching

14 years 8 months ago

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Takuya Kida

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ITC
2000
IEEE

53views Hardware» more ITC 2000»

Using on-chip test pattern compression for full scan SoC designs

13 years 12 months ago

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Helmut Lang, Jens Pfeiffer, Jeff Maguire

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CPM
1999
Springer

93views Combinatorics» more CPM 1999»

Shift-And Approach to Pattern Matching in LZW Compressed Text

13 years 12 months ago

Download www.i.kyushu-u.ac.jp

Takuya Kida, Masayuki Takeda, Ayumi Shinohara, Set...

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VISAPP
2008

145views Computer Vision» more VISAPP 2008»

On the Contribution of Compression to Visual Pattern Recognition

13 years 9 months ago

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