29046 search results - page 5670 / 5810 » Computable Models |
149
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DAC
2004
ACM
16 years 5 months ago
2004
ACM
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...
127
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DAC
2005
ACM
16 years 5 months ago
2005
ACM
Device optimization considering supply voltage Vdd and threshold voltage Vt tuning does not increase chip area but has a great impact on power and performance in the nanometer tec...
115
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
157
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
With ever-increasing power density and cooling costs in modern high-performance systems, dynamic thermal management (DTM) has emerged as an effective technique for guaranteeing th...
117
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IPMI
2005
Springer
16 years 5 months ago
2005
Springer
Obesity has risen to epidemic levels in the United States and around the world. Global indices of obesity such as the body mass index (BMI) have been known to be inaccurate predict...