Many recent techniques for timing analysis under variability, in which delay is an explicit function of underlying parameters, may be described as parameterized timing analysis. T...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
The increasing complexity of today's mixed-signal integrated circuits necessitates both top-down and bottom-up system-level verification. Time-domain state-space modeling and...
Xin Li, Yang Xu, Peng Li, Padmini Gopalakrishnan, ...
As feature sizes shrink, transient failures of on-chip network links become a critical problem. At the same time, many applications require guarantees on both message arrival prob...
Product Data Management (PDM) and Software Configuration Management (SCM) are the disciplines of building and controlling the evolution of a complex artifacts; either physical or ...