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DAC
2007
ACM
14 years 9 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2002
ACM
14 years 9 months ago
Exploiting operation level parallelism through dynamically reconfigurable datapaths
Increasing non-recurring engineering (NRE) and mask costs are making it harder to turn to hardwired Application Specific Integrated Circuit (ASIC) solutions for high performance a...
Zhining Huang, Sharad Malik
DAC
2002
ACM
14 years 9 months ago
ILP-based engineering change
We have developed a generic integer linear programming(ILP)based engineering change(EC) methodology. The EC methodology has three components: enabling, fast, and preserving. Enabl...
Farinaz Koushanfar, Jennifer L. Wong, Jessica Feng...
DAC
2003
ACM
14 years 9 months ago
Optimal integer delay budgeting on directed acyclic graphs
Delay budget is an excess delay each component of a design can tolerate under a given timing constraint. Delay budgeting has been widely exploited to improve the design quality. W...
Elaheh Bozorgzadeh, Soheil Ghiasi, Atsushi Takahas...
DAC
2004
ACM
14 years 9 months ago
Virtual memory window for application-specific reconfigurable coprocessors
Reconfigurable Systems-on-Chip (SoCs) on the market consist of full-fledged processors and large Field-Programmable Gate-Arrays (FPGAs). The latter can be used to implement the sy...
Miljan Vuletic, Laura Pozzi, Paolo Ienne