4299 search results - page 40 / 860 » Concurrent Test Generation |
ICCAD
2000
IEEE
14 years 27 days ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
COMPSAC
2003
IEEE
14 years 1 months ago
2003
IEEE
One of the important tasks during software testing is the generation of test cases. Various approaches have been proposed to automate this task. The approaches available, however,...
DATE
2000
IEEE
14 years 27 days ago
2000
IEEE
We describe a method for on-chip generation of weighted test sequences for synchronous sequential circuits. For combinational circuits, three weights, 0, 0.5 and 1, are sufficien...
OSDI
2008
ACM
14 years 8 months ago
2008
ACM
Concurrency is pervasive in large systems. Unexpected interference among threads often results in "Heisenbugs" that are extremely difficult to reproduce and eliminate. W...
IJFCS
2006
13 years 8 months ago
2006
The outcome of verifying software is often a `counterexample', i.e., a listing of the actions and states of a behavior not satisfying the specification. In order to understan...