4299 search results - page 66 / 860 » Concurrent Test Generation |
158
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SBCCI
2005
ACM
15 years 8 months ago
2005
ACM
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
148
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TSE
2010
14 years 9 months ago
2010
Genetic algorithms (GAs) have been applied previously to UML-driven, stress test requirements generation with the aim of increasing chances of discovering faults relating to networ...
DATE
2006
IEEE
15 years 8 months ago
2006
IEEE
— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent at...
140
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DAC
2004
ACM
15 years 6 months ago
2004
ACM
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests ...
139
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ET
1998
15 years 2 months ago
1998
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...